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Measuring Instrument Product List

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Next-generation real-time ultra-short pulse width measurement device pulseCheck NX

Next-generation real-time ultra-short pulse high-precision measurement and monitoring system capable of maintenance management: pulseCheck NX.

Features ★ The scan range 50 ps model achieves unprecedented time resolution of 50 attoseconds. ★ The electronics are built into the main unit, allowing for SCPI remote control via TCP/IP. ● TPA measurement wavelength: 250 – 3200 nm ● PD, PMT measurement wavelength: 200 – 3200 nm, or 3 – 12 μm ● Measurement pulse width: 5 fs – 15 ps or 10 fs – 40 ps or 20 fs – 500 ps (SM2000) ● Capable of low repetition frequency measurements via trigger input. ● Phase information measurement FROG option can be added. ● High precision, high dynamic range, low noise: With a design based on a newly developed system-on-chip at 18 bits, it enables low latency and smooth measurements, allowing for faster and more accurate measurements of high-resolution attoseconds. ● Intuitive GUI and integrated software with comprehensive data analysis ● Automatic testing and remote control

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Unique Pull Test Type Thin Film Adhesion Strength Measuring Device ROMULUS

Quantitative and accurate measurement of the adhesion strength of thin films coated on substrates using a PC-controlled tensile test with unique stud pins and epoxy-based adhesives.

A unique stud is joined to the sample, and a tensile test is conducted by applying a load under computer control. The load at the time of fracture is displayed, and the unit area calculated from the adhesive area of the stud can be shown. The use of a stud with a uniquely developed epoxy adhesive (adhesive strength of approximately 700 kg/cm²) is optimal. ● Thin film adhesion tests ● Strength tests for adhesives, adhesion, and welding 1. Material stress/strain 2. Bending strength of rigid materials 3. Coating pull-off strength 4. Shear strength of fixed dies, etc. 5. Peel strength of flexible substrates 6. Peel strength of rigid substrates

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